Plasma Cleaner for Transmission Electron Microscope Holders

ucts/services that satisfy the Government�s anticipated needs. BACKGROUND To support of the CHIPS for America Act, the NIST Precision Imaging Facility (PIF) requires a plasma cleaner system to clean hydrocarbons and other contaminants from transmission electron microscopy (TEM) holders and other bul

k items/specimens. The plasma cleaner tool is intended to support the scanning electron microscope, focused ion beam, and transmission electron microscope instruments (among others) in the PIF. NIST is seeking information from sources that