Ion mill for transmission electron microscope specimens

Frist:30 Apr 2026, 17:00 GMT-4

Ausschreibungsinformationen

SAM.gov

GAITHERSBURG, Vereinigte Staaten

Art: Sources Sought
Verfahren: Sources Sought
Referenznummer: 1b0ab7b24705462a9e46402504adc123
NAICS: 334516

Notice ID Number: NIST-SS26-109 Title: Ion mill for transmission electron microscope specimens The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products…

/services that satisfy the Government�s anticipated needs. BACKGROUND To support the CHIPS for America Act, the NIST Precision Imaging Facility (PIF) requires an ion milling system to provide final thinning to transmission electron microscope specimens. The coating system is intended to support the

scanning electron microscope, focused ion beam, and transmission electron microscope instruments (among others) in the PIF. NIST is seeking information from sources that may be capable of providing a solution that will achieve the objective

Alle Ausschreibungsinformationen anzeigen

Dokumente

Alle wichtigen Termine anzeigen

Ähnliche Ausschreibungen

Alle Ausschreibungen in den USA