Scanning electron and focussed ion beam microscope (FIB-SEM)
Ausschreibungsinformationen
TED EUZürich, Switzerland
- Art
- 29
- Verfahren
- open
- Referenznummer
- 726424-2024
- Geschätzter Wert
- 1,259,958 EUR
- CPV
- 38511100
Scanning electron and focussed ion beam microscope (FIB-SEM)