300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Frist:16 Jul 2026, 00:00 CEST
Ausschreibungsinformationen
TED EUFrankfurt (Oder), Germany
- Art
- 16
- Verfahren
- open
- Referenznummer
- 413311-2026
- CPV
- 38341300
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz