Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples

learized Transmission Electron Microscope (TEM), two nuclearized Scanning Electron Microscopes (SEM), a Focused Ion Beam (FIB) as well as two standards SEM. The service will include preventive maintenance of the equipment and repairs as well as provision of spare parts.

JRC Karlsruhe intends to make a call for tender for the maintenance of their equipment used for microstructure investigation. It consists in a set of devices including a shielded electron probe microanalyser (EPMA) a nuc