Low-Temperature (LT) Scanning Probe Microscope (SPM)
Frist:23 Jun 2026, 10:30 GMT-4
Ausschreibungsinformationen
SAM.govUpton, United States
- Art
- Combined Synopsis/Solicitation
- Verfahren
- Combined Synopsis/Solicitation
- Referenznummer
- c5510bb6370c49fa8964e5bcd71293ec
- NAICS
- 334516
BSA is procuring the Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and development of a lowtemperature scanning probe microsc…