Process Development for and Fabrication of APSM Set and Overlay Metrology Wafers
Frist:14 May 2026, 12:00 GMT-4
Ausschreibungsinformationen
SAM.govUnited States
- Art
- Special Notice
- Verfahren
- Special Notice
- Referenznummer
- e303a61efb98465ba7ec5348cc3dd421
- NAICS
- 334413
GENERAL INFORMATION This is combined sources sought notice and notice of intent to sole source. The purpose of this so notice is to conduct market research and identify potential sources of commercial products/services t…