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Defect inspection system

Deadline:28 Jul 2026

Tender information

TED EU

Espoo, Finland

Type
16
Procedure
open
Ref. number
413000-2026
CPV
38000000

VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-

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