Defect inspection system
Deadline:28 Jul 2026
Tender information
TED EUEspoo, Finland
- Type
- 16
- Procedure
- open
- Ref. number
- 413000-2026
- CPV
- 38000000
VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-…