- Type
- 25
- Procedure
- neg-wo-call
- Ref. number
- 168808-2024
- Estimated value
- 15,750,000 DKK
- CPV
- 38000000
Helios 5 UC with secondary ion mass spectrometerThe proposed product represents a significant advancement in scientific instrumentation, combining cutting-edge technologies to enable precise material characterization. Th…
e key features and specifications (please see PDF "Extended information") that make this product uniquely suited for our specific needs within the Danish national infrastructure cluster “NANOCHEM” are outlined.The product seamlessly integrates several critical functionalities, including advanced sca
nning-electron microscopy (SEM), focused ion beam (FIB) nanofabrication, sample preparation for transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), and secondary ion mass spectrometer (SIMS). These capabilities all