FoS/UPOL – compact portable profilometer II

rface texture and roughness, surface shape and manufacturing defects of functional surfaces of optical components. The measurements shall be possible on freely positioned elements. The equipment must also allow the above parameters to be checked on the machined surface of the optical element being m

anufactured, which is placed directly in the machine. Measurements inside the machine tool must be possible without having to handle the element under test. The measured data will allow the quality of the optical surface to be evaluated and