- Type
- 25
- Procedure
- neg-wo-call
- Ref. number
- 116468-2025
- Estimated value
- 720,000 EUR
- CPV
- 38000000
Infrared Photo-induced Force Microscopy (IR PiFM) is a unique analytical technique that allows spectral imaging of materials with a high lateral resolution of < 5 nm. The material sample is radiated with a tunable IR las…
er, and the photo-induced force between the sample and a metal coated cantilever tip is recorded. The magnitude of the short-range force depends on two factors: (i) the non-contact distance between the sample surface and the tip, and (ii) the content of the functional groups that absorb the IR radia
tion at a specific wavenumber. The instrument will be part of the Bioeconomy Infrastructure at Aalto University, where atomic force microscopy (AFM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) have been us