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Aanschaf Dual Beam Focussed Ion Beam en Scanning Elektronen Microscoop (FIB-SEM) voor het NFI

Deadline:21 Mar 2024

Tender information

TED EU

Bilthoven, Netherlands

Type
16
Procedure
open
Ref. number
87018-2024
Estimated value
2,245,000 EUR
CPV
38511000

Link categoriemanagement: https://www.rivm.nl/contact/zakendoen-met-rivm

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