Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)
Deadline:31 Jul 2024, 00:00 CEST
Tender information
TED EUEggenstein-Leopoldshafen, Germany
- Type
- 16
- Procedure
- open
- Ref. number
- 393335-2024
- CPV
- 38511000
Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)