Cryogenic electron microscopy system with 300 kV transmission cryo-electron microscope and cryogenic focused ion beam scanning electron microscope

h equipment offering higher resolution for both single-particle and tomography analysis. To enable this, we will establish an integrated workflow for producing samples for tomography and single-particle analysis. Specifically, we will acquire a 300 kV cryogenic transmission electron microscope (cryo

-TEM) suitable for high-resolution structural biology, together with a software and hardware compatible cryogenic focused ion beam scanning electron microscope (cryo-FIBSEM) for lamella sample preparation required in high-resolution tomogra