200 mm Wafer Prober incl. Temperature Testing - PR874550

0 mm wafers. The focus in the usage of the machine does not depend on short handling time and high throughput, but on accuracy in probing and possibility for stimulation of optical and magnetical sensors. For stimulation of optical sensors a darkened DuT chamber is mandatory. The Wafer Chuck has to

be made off non-magnetic metarials to prevent distortion while characterizing magnetic field sensors. Options: 2.1 Installing Conditions AC Voltage (prefered specifications) 230 V 50 Hz, 16 A fuse 3.3 Wafer probing Optional: Wafer thickness