UCC-2025-35 - RFT for the Supply, Delivery, Installation, Commissioning, Calibration, Validation of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer, for Tyndall National Institute.

ll-wafer mapping. The system must support routine monitoring on 100 mm and up to 200 mm wafers and be compatible with bare and processed wafers including thin films, epitaxial layers, and compound semiconductor substrates. The Spectrometer must be suitable for in a research cleanroom environment, wi

th robust software control, recipe management, and data export.