Prior Information Notice – RF Measurement System for On-Wafer Characterisation

haracterisation of semiconductor devices, circuits and demonstrators, including single-ended and differential measurements in the mmWave frequency range. It is intended to support advanced heterointegration processes and ensure reliable and high-quality measurement results. The equipment shall enabl

e automated, high-precision measurements and provide a versatile platform for RF analysis, including network and spectrum measurements. It will be integrated into existing cleanroom and measurement environments. The procurement procedure is