Scanning electron and focussed ion beam microscope (FIB-SEM)
Deadline:10 Jul 2024, 01:00 CEST
Tender information
TED EUZürich, Switzerland
- Type
- 16
- Procedure
- open
- Ref. number
- 327803-2024
- CPV
- 38511100
A high-performance dual-beam device consisting of a focussed ion beam (gallium) and a field emission scanning electron microscope. Applicable for a wide range of sample preparation and characterisation in the micro and n…