- Type
- 29
- Procedure
- neg-wo-call
- Ref. number
- 352373-2026
- Estimated value
- 775,000 EUR
- CPV
- 38511000
The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foun…
dations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. Th
e instrument must meet the following critical performance criteria: • High temporal and spatial coherence at accelerations voltages up to 30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with m