Wafer inspection system (WIS) - PR1006153-2350 -W
Tender information
TED EUMünchen, Germany
- Type
- 29
- Procedure
- neg-wo-call
- Ref. number
- 826185-2025
- CPV
- 42990000
PR1006153-2350 -W Automatisiertes Waferinspektiosnsystem /Wafer inspection system (WIS) with automated handling and sorting station for the characterization and classification of crystalline silicon wafers for solar cell…