Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)

he FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.

Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements t