JPA2026ID76 - 1
Tender information
TED EUHeverlee, Belgium
- Type
- 16
- Procedure
- neg-w-call
- Ref. number
- 382478-2026
- CPV
- 38000000
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
Heverlee, Belgium
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM