Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software.
Deadline:31 Jul 2026, 09:00 GMT-4
Tender information
SAM.govGAITHERSBURG, United States
- Type
- Sources Sought
- Procedure
- Sources Sought
- Ref. number
- 58ad028e04c243f88d0e5009df20e129
- NAICS
- 334516