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ATOMIC FORCE MICROSCOPE FOR WAFER-SCALE-IMAGING

Deadline:22 Aug 2019, 12:00 GMT-4

Tender information

SAM.gov

GAITHERSBURG, United States

Type
Combined Synopsis/Solicitation
Procedure
Combined Synopsis/Solicitation
Ref. number
1d65f5fd86ea9c0cfaf16c2a49342fe6
NAICS
334516
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