CHIPS Microchannel plate gate upgrade module� Combined Sources Sought/Notice of Intent to Sole Source

semiconductor industry. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts using atom probe tomography (APT). A particular research focus of the atom probe instrument is to study the effect of lase

r wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. This work involves three-dime