- Type
- goods (award)
- Procedure
- Open
- Ref. number
- 2f4b3f72-d7aa-484e-81f2-d0fbda51a616
- CPV
- 38000000
The tender concerns the procurement of an integrated system for optical and opto-electrical characterization at wafer and chip level in the visible (VIS) spectral range. The system shall consist of a 200 mm semi-automate…
d probe station equipped with a temperature-controlled chuck, microscope, and manual manipulators for RF/DC probes as well as for optical fibers and fiber arrays. The system will be installed in a laboratory environment outside the cleanroom.
The scope of supply includes delivery to the point of us
e (laboratory), installation, commissioning, and two days of user training. The system must be new (no refurbished chambers or parts) and comply fully with CE requirements and the applicable EU Machinery Directive (2006/42/EC as amended). T