Surface inspection system for defect detection on wafers - PR880078-3220-P
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (tender)
- Procedure
- Negotiated with prior publication of a call for competition / competitive with negotiation
- Ref. number
- 1b758554-b3f2-4c3d-b8c0-241e22d98e63
- CPV
- 31712330
Surface inspection system for defect detection on wafers