Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (award)
- Procedure
- Negotiated with prior publication of a call for competition / competitive with negotiation
- Ref. number
- 90ac6b5c-151c-4c2b-b8b4-65b36e6c2212
- CPV
- 38511100
Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2)