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Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

Tender information

DE_BKMS

München, Germany

Type
goods (award)
Procedure
Negotiated with prior publication of a call for competition / competitive with negotiation
Ref. number
90ac6b5c-151c-4c2b-b8b4-65b36e6c2212
CPV
38511100

Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2)

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