- Type
- goods (tender)
- Procedure
- Open
- Ref. number
- 04043c57-d020-4901-b289-b7c1aa85474b
- CPV
- 38000000
The Walther-Meißner-Institute will acquire an X-ray/Ultraviolet Photoelectron Spectroscopy (XPS/UPS) system for the characterization of metallic, semiconducting, and insulating thin films, and bulk materials. This includ…
es the characterization of substrate surfaces, characterization of oxide layers by measuring the chemical shift and valence state, determining the oxide layer thickness using angle-resolved XPS, stoichiometry analysis of thin film samples, depth profiling of chemical composition, and measuring the e
lectronic structure of different materials. The system should be operational as stand-alone system but also in connection with an existing ultra-high vacuum (UHV) MBE-PLD deposition system from DCA Instruments Oy. Therefore, fast and easy s