200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Deadline:24 Jul 2026, 12:00 CEST
Tender information
DE_BKMSFrankfurt (Oder), Germany
- Type
- goods (tender)
- Procedure
- Open
- Ref. number
- 6caea2c2-9538-475f-9f08-e59661c4366f
- CPV
- 38341300
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz