Raster-Scan-Mikroskop/SIM Mikroskop - PR560499-3870-W
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (award)
- Procedure
- Negotiated without prior call for competition
- Ref. number
- b109f36f-5992-4296-ad78-ed0969bc6c3f
- CPV
- 38433100
Raster-Scan-Mikroskop/SIM Mikroskop