Focus Ion Beam Rasterelektronenmikroskop für die Inspektion und EDX-Analyse von 200mm Wafern - PR468071 -2390 - W

München, Germany

Type

goods (tender)

Procedure

Negotiated with prior publication of a call for competition / competitive with negotiation

Ref. number

a8ee9f88-cf3e-4177-bda0-e8f3c6444b6e

CPV

38511100

Documents