Surface inspection system for defect detection on wafers - PR880078-3220-P
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (award)
- Procedure
- Negotiated with prior publication of a call for competition / competitive with negotiation
- Ref. number
- e9f1ff62-1cf9-4c7a-a174-f3c76d30de26
- CPV
- 31712330
Surface inspection system for defect detection on wafers