Wafer inspection system (WIS) - PR1006153-2350 -W
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (award)
- Procedure
- Negotiated without prior call for competition
- Ref. number
- 2dd053d6-9bf6-44f2-9c62-04c8bf3560e7
- CPV
- 42990000
PR1006153-2350 -W Automatisiertes Waferinspektiosnsystem /Wafer inspection system (WIS) with automated handling and sorting station for the characterization and classification of crystalline silicon wafers for solar cell…