Surface inspection system for defect detection on wafers - PR880078-3220-P
Tender information
DE_BKMSMünchen, Germany
- Type
- goods (tender)
- Procedure
- Negotiated with prior publication of a call for competition / competitive with negotiation
- Ref. number
- fb6083f8-6b10-4d2b-9ed8-339dd92678f9
- CPV
- 31712330
Surface inspection system for defect detection on wafers