Scanning Electron Microscopy (SEM)
Tender information
AT_KDQ_XMLAustria
- Type
- Lieferauftrag
- Procedure
- Verhandlungsverfahren mit vorheriger Bekanntmachung
- Ref. number
- a2c49245-23b2-46e1-acc7-c5a78913a090:69fd5fac-6da6-4954-9d52-3cc91a5dacf4
- Estimated value
- 360,542 EUR
- CPV
- 38000000
Studying the surface of materials with different detectors allows to monitor the surface morphology, the microstructure and, among others, the chemical composition in the range from several 100 nm to the millimeter scale