Scanning electron and focussed ion beam microscope (FIB-SEM)
Tender information
TED EUZürich, Switzerland
- Type
- 29
- Procedure
- open
- Ref. number
- 726424-2024
- Estimated value
- 1,259,958 EUR
- CPV
- 38511100
Scanning electron and focussed ion beam microscope (FIB-SEM)