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Focused Ion Beam (FIB) System

Deadline:31 Jul 2024, 00:00 CEST

Tender information

TED EU

Eggenstein-Leopoldshafen, Germany

Type
16
Procedure
open
Ref. number
394735-2024
CPV
38511000

Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)

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