Closed
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Deadline:16 Jul 2026, 00:00 CEST
Tender information
TED EUFrankfurt (Oder), Germany
- Type
- 16
- Procedure
- open
- Ref. number
- 413311-2026
- CPV
- 38341300
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz