FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope

rum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, sp

ecial acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D ima