Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion Beam–Scanning Electron Microscope (FIB.SEM) for Tyndall Instit, UCC,

One (1) Aberration-corrected and monochromated TEM 2. One (1) 200 kV high-throughput TEM 3. One (1) Focused Ion Beam–Scanning Electron Microscope (FIB-SEM) This procurement will establish a nationally significant microscopy capability for Ireland, strengthening Tyndall’s leadership in semiconductor,

photonic, and quantum materials research and supporting long-term collaboration with academic and industrial stakeholders. The TEM Suite will deliver sustained scientific, technological, and economic impact through enhanced analytical capa