LA3208C - DCU - RFT for the Supply, Delivery, Installation, and Commissioning of an X-ray/Hard X-ray Photoelectron Spectrometer Platform with Imaging and Advanced Characterisation Capabilities

risation methods into a single, user-friendly instrument. The system will be able to provide XPS spectroscopy at higher photon energy than commonly used in laboratories, the system must be able to operate in imaging mode creating elemental maps and be able to provide additional measurement modes inc

luding: Scanning electron microscopy SEM for sample inspection/area selection, Scanning Auger microscopy SAM for complementary elemental analysis, UV photoelectron spectroscopy UPS for higher resolution valence band measurements, Inverse ph