Closed
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Deadline:24 Jul 2026, 12:00 CEST
Tender information
TED EUFrankfurt (Oder), Germany
- Type
- 16
- Procedure
- Open procedure
- Ref. number
- 432100-2026
- CPV
- 38341300 Instruments for measuring electrical quantities
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
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