UCC-2025-28 Supply, Delivery, Installation, Commission, Calibration, and Validation of Integrated X-ray Photoelectron Spectroscopy (XPS) System with Collocated Raman Spectroscopy Module for TNI, UCC

ed Raman Spectroscopy Module, comprising two primary components: (i) XPS Module: For chemical composition and electronic structure analysis of thin films (metal oxides and 2D materials) produced by Atomic Layer Deposition (ALD) facility within Europe’s first beyond-2 nm System-on-Chip (SoC) pilot li

ne. (ii) Raman Spectroscopy Module: For structural, vibrational, and stress analysis of the same thin-film materials (metal oxides and 2D materials) from the atomic layer processing facility. This fully integrated system will provide essent