Supply, Delivery of Wafer Prober System for Tyndall National Institute, UCC

ope and a sample stage, equipped with automated probes with a positioning resolution down to 200nm. This probe system is for electrical characterisation of ultra-small devices (in nano or micron scales).

Tyndall National Institute, UCC, III-V group is seeking to purchase Wafer Prober System that will be used for semiconductor devices characterization and analysis. The Wafer Prober System platform should include a microsc