Low-Temperature (LT) Scanning Probe Microscope (SPM)

ope (LT-SPM) and its integration into the existing multiprobe system without compromising or sacrificing any original system functionality. The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal elec

tronics, and all necessary wiring and cabling, while utilizing an existing cryostat previously purchased from the same Supplier for a prior LT-STM system. All SPM cabling will be compatible with the existing Scienta Omicron MATRIX SPM contr