Closed
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Deadline:16 Jul 2026, 12:00 CEST
Tender information
DE_BKMSFrankfurt (Oder), Germany
- Type
- goods (tender)
- Procedure
- Open
- Ref. number
- 736a6023-f83e-4608-80a6-a7eaddb358f6
- CPV
- 38341300
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz