Closed
Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)
Deadline:31 Jul 2024, 12:00 CEST
Tender information
DE_BKMSEggenstein-Leopoldshafen, Germany
- Type
- tender
- Procedure
- Open
- Ref. number
- 0abd79d2-79af-4867-b5fa-c746cca4d5ac
- CPV
- 38511000
Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)