Focused Ion Beam (FIB) System
Deadline:31 Jul 2024, 12:00 CEST
Tender information
DE_BKMSEggenstein-Leopoldshafen, Germany
- Type
- tender
- Procedure
- Open
- Ref. number
- 55c4ef97-4027-47fa-9e6a-fb1e6c70c09f
- CPV
- 38511000
Plasma FIB Dual-Beam-Elektronenmikroskop (P-FIB)